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NandFlash Function Test System
The CBA board, which is the Test MAIN Board of the CBA System, is mounted on the TEST HEAD BOX and then interfaced with the TEL P-12XLM probe station to test the Cell & Peripheral of Samsung NAND FLASH Wafer.
The CBA board, which is the Test MAIN Board of the CBA System, is mounted on the TEST HEAD BOX and then interfaced with the TEL P-12XLM probe station to test the Cell & Peripheral of Samsung NAND FLASH Wafer.
